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- Zusatztext
The success of the Springer Series Applied Scanning Probe Methods I¿VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.
- Kurztext
First book summarizing the state-of-the-art of this techniqueReal industrial applications includedIncludes supplementary material: sn.pub/extras
- Autorenportrait
InhaltsangabeLuca Gavioli and Cinzia Cepek: Ultra-thin fullerene-based films via STM and STS.- Alexander Gigler and Othmar Marti: Quantitative measurement of materials properties with the (Digital) Pulsed Force Mode.- Bruno Pignataro: Advances in SPMs for Solid Supported Monolayers Investigation and Modification.- Félix Rico, Ewa P. Wojocikiewicz, and V. Moy: Atomic force microscopy studies of the mechanical properties of living cells.- Claire Verbelen, Guillaume Andre, Xavier Haulot, Yann Gilbert, David Alsteenes, Etienne Dague, and Y. F. Dufrene: Exploring microbial surfaces using AFM imaging and force spectroscopy.- C. Riethmüller and H. Oberleithner: Cellular Physiology of Epithel and Endothel.- Hyonchol Kim, Hironori Uehara, Rehana Afrin, Hiroshi Sekiguchi, Hideo Arakawa, Toshiya Osada, and Atsushi Ikai: Application of the Atomic Force Microscopy to the Study of Expressed Molecules in or on a Single Living Cell.- Annalisa Relini, Claudio Canale, Ornella Cavalleri, Tiziana Svaldo Lanero, Ranieri Rolandi, and Alessandra Gliozzi: What can atomic force microscopy say about amyloid aggregates?.- Zoya Leonenko, Matthias Amrein, David T. Cramb, and Eric Finot: Atomic force microscopy: interaction forces in phospholipid monolayers, bilayers and cell membranes.- Enamul Hoque, James DeRose, B. Bhushan, and H. J. Mathieu: Self-Assembled Monolayers (SAM) on Aluminum and Copper Oxide Surfaces: Surface and Interface Characteristics, Nanotribological Properties, and Chemical Stability.- Nikhil S. Tambe and Bharat Bhushan: High Sliding Velocity Nanotribological Investigations of Materials for Nanotechnology Applications.- Sung-Kyoung Kim and Haiwon Lee: Measurement of Mechanical Properties of One-Dimensional Polymer Nanostructures by AFM.- Sriram Sundararajan and K. S. Kanaga Karuppiah: Evaluating Interfacial Properties of Polymeric Materials for Total Joint Replacements Using ScanningProbe Microscopy.- Toshiharu Saiki: Near-field optical spectroscopy of single quantum constituents
The success of the Springer Series Applied Scanning Probe Methods I¿VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.
