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- Zusatztext
The success of the Springer Series Applied Scanning Probe Methods I¿VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.
- Kurztext
First book summarizing the state-of-the-art of this techniqueReal industrial applications includedIncludes supplementary material: sn.pub/extras
- Autorenportrait
InhaltsangabeBharat Bhushan and Robert A. Sayer: Gecko Feet: Natural Attachment Systems for Smart Adhesion-Mechanism, Modeling and Development of Bio-Inspired Materials.- Filippo Giannazzo, Patrick Fiorenza, Vito Raineri: Carrier transport in advanced semiconductor materials.- Yasuo Cho: Visualization of fixed charges stored in condensed matter and its application to memory technology.- Toshi Kasai, Haresh Siriwardane and Bharat Bhushan: Applications of SPM in Chemical Mechanical Planarization (CMP).- Ken-ichi Shinohara: Scanning probe microscope application for single molecules in a p-conjugated polymer toward the molecular devices based on polymer chemistry.- Joachim Loos and Alexander Alexeev: Scanning Probe Microscopy on Polymer Solar Cells.- Hiroyuki Sugimura: Scanning probe anodization for nanopatterning.- Mario D'Acunto, Franco Maria Montevecchi, Paolo Giusti and Gianluca Ciardelli: Tissue Engineering: Nanoscale Contacts in Cell Adhesion to Substrates.- Tatsuo Ushiki and Kazushige Kawabata: Scanning probe microscopy in biological research.- Jiping Ye: Novel nanoindentation techniques and their applications.- Yasushi Kadota: Application to nano-dispersion macromolecule material evaluation in an electrophotographic printer.- Tianming Bao, David Fong, and Sean Hand: Automated AFM as Industrial Process Metrology for Nanoelectronic Manufacturing
The success of the Springer Series Applied Scanning Probe Methods I¿VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.
